Patent · US Active

Deflectometry measurement system

US12000752B2 · kind B2 · utility

0Cited by

4References

18Claims

0Family size

Assignee

LAMBDA-X OPHTHALMICS · BE

Inventors

Philippe Antoine · Walhain, BE
Didier Beghuin · Herne, BE
Luc Joannes · Gembloux, BE

Key dates

Filing date	Apr 24, 2020
Grant date	Jun 4, 2024
Priority date	—
Expiry date	Jul 9, 2040

Classification

Technology area (CPC G)Physics
CPC primaryG02F2203/50
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A system for measuring (200) a sample (2) by deflectometry comprising:

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.