Character defect detection method and device
US12002198B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 30, 2020 |
| Grant date | Jun 4, 2024 |
| Priority date | — |
| Expiry date | Jan 1, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30176
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A character defect detection method and device are disclosed. The character defect detection method comprises: acquiring an image to be inspected containing a character and a template character image corresponding to the character, and converting the image to be inspected into an image having a format consistent with a format of the template character image; extracting a first valid area containing the character from the image to be inspected, and extracting a second valid area containing a template character from the template character image; obtaining a first image based on the first valid area, and obtaining a second image based on the second valid area; calculating a transformed image indicating an information difference between the first image and the second image based on the first image and the second image; and obtaining a character defect detection result of the image to be inspected based on information of the transformed image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.