Patent · US Active

Particle manipulation system with multisort valve and focusing element

US12005453B2 · kind B2 · utility

0Cited by
0References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 20, 2020
Grant dateJun 11, 2024
Priority date
Expiry dateFeb 5, 2043

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2201/06113
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A particle manipulation system uses a MEMS-based, microfabricated particle manipulation device which has a sample inlet channel, output channels, and a movable member formed on a substrate. The device may be used to separate a target particle from non-target material in a sample stream. In order to improve the sorter speed, accuracy or yield, the particle manipulation system may also include a microfluidic structure which focuses the target particles in a particular portion of the sample inlet channel. The particle manipulation device may have two separate sort output channels, wherein the sort channel used depends on the characteristics of the sort pulse delivered to the micromechanical particle manipulation device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.