Device and method for ultrashort pulse temporal measurement
US12007274B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 8, 2018 |
| Grant date | Jun 11, 2024 |
| Priority date | — |
| Expiry date | Mar 5, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R29/08
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present disclosure relates to laser systems and laser pulse measurement methods. The method comprises a dispersive system for applying a controlled chirp, to an incoming ultrashort light pulse to be measured; an optical system for selecting an homogeneous part of the transverse spatial beam profile of said light pulse; applying different spectral phases to different spatial parts of the beam obtained in the previous step, which comprises allowing different spatial parts of the beam to cross different thicknesses of material; focusing or propagating the beam in a nonlinear medium after applying the spectral phases; applying a nonlinear process to the pulse to be characterized for each spatial part of the beam, allowing the generation of a nonlinear signal for each spatial part of the beam; measuring the corresponding bi-dimensional data set that has the information on the nonlinear signal generated for each applied spectral phase in a detector; applying a numerical iterative algorithm to the measured data set to retrieve the spectral phase of the pulse to be characterized; such process being done in a parallel fashion.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.