Sample holder, system and method
US12007339B2 · kind B2 · utility
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1References
20Claims
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Assignee
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Key dates
| Filing date | Sep 9, 2021 |
| Grant date | Jun 11, 2024 |
| Priority date | — |
| Expiry date | Aug 5, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/6462
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A sample holder for holding a sample during an X-ray imaging process includes a sample placement surface on which the sample is placed for positioning the sample in a depth direction of the sample holder. The sample holder also includes a first alignment portion for aligning the sample in a width direction of the sample holder, and a second alignment portion for aligning the sample in a height direction of the sample holder.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.