Patent · US Active

Method and device for creating a model of a technical system from measurements

US12008295B2 · kind B2 · utility

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13Claims
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Key dates

Filing dateJan 25, 2021
Grant dateJun 11, 2024
Priority date
Expiry dateNov 18, 2042

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F2111/10
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method for creating a model of a technical system as a function of measured sensor data of the technical system. The method includes the following steps: initializing a symbolic regression problem. A list of mathematical functions is established, including at least one linear and/or non-linear function and/or at least a one-dimensional parameterizable characteristic curve. The at least one-dimensional characteristic curve is implemented by a Smoothed Grid Regression (SGR) model. Solving the symbolic regression problem with the aid of a genetic algorithm.

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