Method and device for creating a model of a technical system from measurements
US12008295B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 25, 2021 |
| Grant date | Jun 11, 2024 |
| Priority date | — |
| Expiry date | Nov 18, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2111/10
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for creating a model of a technical system as a function of measured sensor data of the technical system. The method includes the following steps: initializing a symbolic regression problem. A list of mathematical functions is established, including at least one linear and/or non-linear function and/or at least a one-dimensional parameterizable characteristic curve. The at least one-dimensional characteristic curve is implemented by a Smoothed Grid Regression (SGR) model. Solving the symbolic regression problem with the aid of a genetic algorithm.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.