Mapping field anomalies using digital images and machine learning models
US12008744B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 9, 2019 |
| Grant date | Jun 11, 2024 |
| Priority date | — |
| Expiry date | Aug 11, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V20/194
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A computer-implemented method for generating an improved map of field anomalies using digital images and machine learning models is disclosed. In an embodiment, a method comprises: obtaining a shapefile that defines boundaries of an agricultural plot and boundaries of the field containing the plot; obtaining a plurality of plot images within the field from one or more image capturing devices that are located within the boundaries of the field; calibrating and pre-processing the plurality of plot images to create a plot map of the agricultural plot at a plot level; based on the plot map of the agricultural plot, generating a plot grid; based on the plot grid and the plot map, generating a plurality of plot tiles; based on the plurality of plot tiles, generating, using a first machine learning model and a plurality of first image classifiers corresponding to one or more first anomalies, a set of classified plot images that depicts at least one anomaly; based on the set of classified plot images, generating a plot anomaly map for the agricultural plot; transmitting the plot anomaly map to one or more controllers that control one or more agricultural machines or database systems to per…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.