TIA bandwidth testing system and method
US12013423B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 28, 2021 |
| Grant date | Jun 18, 2024 |
| Priority date | — |
| Expiry date | Sep 28, 2041 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B10/07
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
A system and method for testing the bandwidth of an amplifier by forcing the amplifier into an oscillation with a feedback signal. The oscillation frequency reveals the amplifier bandwidth. The system comprises an amplifier an input and an output, the amplifier output providing an amplifier output signal. A feedback system is configured to receive the amplifier output signal, process an amplifier output signal to create a feedback signal, provide the feedback signal to the amplifier input. Also part of this system is a frequency divider having an input connected to the amplifier output. The frequency divider is configured to reduce the frequency of the amplifier output signal to create a reduced frequency signal and provide the reduced frequency signal to test equipment which is configured to measure the frequency of the reduced frequency signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.