Method of detecting defective pixels in electronic displays
US12013602B2 · kind B2 · utility
0Cited by
3References
5Claims
0Family size
Assignee
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Key dates
| Filing date | Dec 22, 2021 |
| Grant date | Jun 18, 2024 |
| Priority date | — |
| Expiry date | Jul 9, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30121
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of detecting a defect in an electronic display includes taking a digital image of the electronic display; and electronically determining if an area of the electronic display is defective based on data of the digital image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.