Patent · US Active

Intelligent application scenario testing and error detection

US12013776B2 · kind B2 · utility

0Cited by

11References

20Claims

0Family size

Assignee

International Business Machines Corporation · US

Inventors

Adi I. Botea · Dublin, IE
Larisa Shwartz · Scarsdale, US
Akihiro Kishimoto · Osaka, JP
Radu Marinescu · Dublin, IE
Yufang Hou · Dublin, IE
Hiroshi Kajino · Kita Nagoya, JP
Mattia Chiari · Capodimonte, IT
Marco Luca Sbodio · Ongar, IE

Key dates

Filing date	Apr 3, 2020
Grant date	Jun 18, 2024
Priority date	—
Expiry date	Jan 23, 2042

Classification

Technology area (CPC G)Physics
CPC primaryG06N7/01
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Embodiments for intelligent application scenario testing and error detection by a processor. One or more modified application scenarios may be automatically generated from an initial application scenario having configuration data and a plurality of operations relating to an error. The one or more modified application scenarios are variations of the initial application. The one or more modified application scenarios may be executed to detect the existence or non-existence of the error in the one or more modified application scenarios.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.