Machine learning-based patent quality metric
US12014250B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 27, 2020 |
| Grant date | Jun 18, 2024 |
| Priority date | — |
| Expiry date | Mar 20, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N3/086
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A machine-learning based artificial intelligence device for finding an estimate of patent quality, such as patent lifetime or term is disclosed. Such a device may receive a first set of patent data and generate a list of binary classifiers. A candidate set of binary classifiers may be selected and using a heuristic search, for example an artificial neural network (ANN), a genetic algorithm, a final set of binary classifiers is found by maximizing iteratively a yield according to a cost function, such an area under a curve (AUC) of a receiver operating characteristic (ROC). The device may then receive patent information for a target patent and report an estimate of patent quality according to the final set of binary classifiers.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.