Method of testing a microdevice in integrated systems
US12014660B2 · kind B2 · utility
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11References
10Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Mar 7, 2022 |
| Grant date | Jun 18, 2024 |
| Priority date | — |
| Expiry date | Mar 7, 2042 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T29/49128
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
What is disclosed are structures and methods for testing and repairing emissive display systems. Systems are tested with use of temporary electrodes which allow operation of the system during testing and are removed afterward. Systems are repaired after identification of defective devices with use of redundant switching from defective devices to functional devices provided on repair contact pads.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.