Defect detection method, apparatus, and device for semi-conducting bedding layer of power cable
US12019044B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Jan 21, 2022 |
| Grant date | Jun 25, 2024 |
| Priority date | — |
| Expiry date | Jan 21, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F17/15
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Defect detection method for a semi-conducting bedding layer of a power cable includes: obtaining a length parameter, a corrugation pitch parameter, radius parameters, and a thickness parameter of a power cable; obtaining a first resistance value between a shield and a corrugated sheath, and calculating a second resistance value of the shield based on the length parameter and the corrugation pitch parameter; calculating a radial resistance value of the semi-conducting bedding layer based on the first resistance value and the second resistance value; determining a contact angle of a critical point of contact between the corrugated sheath and the semi-conducting bedding layer based on the radius parameters and the thickness parameter; calculating volume resistivity of the semi-conducting bedding layer based on the radial resistance value and the contact angle; and comparing the volume resistivity with a preset evaluation parameter to obtain a defect detection result of the semi-conducting bedding layer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.