System and method for marking substrates within improved line recovery time
US12019501B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 12, 2020 |
| Grant date | Jun 25, 2024 |
| Priority date | — |
| Expiry date | Feb 3, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06Q10/20
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system having a plurality of marking and/or coding devices and a computing system coupled to the devices and having processor configured to: receive sensor data associated with each device; and store printer metadata and batch job metadata in a backup file for each device. The processor is configured to classify a fault condition of a respective one device based on one or more of received sensor data, device self-test data, current operational data and historical device condition data. The processor is configured to determine autonomously a repair process recommendation in response to the classified fault condition and based on an estimated time to repair (ETR) the device using a self-repair recovery process relative to a line recovery time (LRT) threshold. The processor is configured to recommend as the repair process recommendation the self-repair recovery process in response to the ETR being less than or equal to the LRT threshold.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.