Event-based diagnostic information collection
US12019505B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 14, 2022 |
| Grant date | Jun 25, 2024 |
| Priority date | — |
| Expiry date | Oct 19, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/0766
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An example computing device includes a processor and a memory coupled to the processor. The memory may include a diagnostic daemon executing in a user space. The diagnostic daemon may include a plugin layer and a plurality of plugins communicatively connected to the plugin layer. Each plugin may perform at least one operation related to diagnostic data collection. The plugin layer may receive an event from a component running in the computing device upon the component encountering an error. The event may include a plugin identifier and an operation identifier. Further, the plugin layer may route the event to a plugin of the plurality of plugins based on the plugin identifier. Furthermore, the plugin may determine an operation to be performed corresponding to the component based on the operation identifier and execute the operation to collect a type of diagnostic information specified for the component.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.