Temperature prediction system and method for predicting a temperature of a chip of a PCIE card of a server
US12019530B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Jun 7, 2021 |
| Grant date | Jun 25, 2024 |
| Priority date | — |
| Expiry date | Dec 25, 2041 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05K7/20209
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
To predict a temperature of a chip of a PCIe card of a server, use a gated recurrent unit of a recurrent neural network to define a temperature prediction model for the chip, collect training data of the temperature prediction model according to mutual response changes of control variables, use the training data to train the temperature prediction model to obtain a training result close to a measured temperature of the chip and evaluate the training result to obtain features that best reflect the temperature change of the chip, perform an error analysis on the training result to obtain a set of key features from the features, form a temperature predictor according to the set of key features and the temperature prediction model, and generate a predicted temperature of the chip by the temperature predictor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.