Patent · US Active

Method and apparatus for automated test plan generation to measure a measurement object

US12019958B2 · kind B2 · utility

0Cited by

1References

19Claims

0Family size

Assignee

Carl Zeiss Industrielle Messtechnik GmbH · DE

Inventors

Ana Carolina Mayr Adam · Aalen, DE
Stephan Rieger · Oberkochen, DE
Florian Mayer · Freiberg am Neckar, DE

Key dates

Filing date	Nov 17, 2020
Grant date	Jun 25, 2024
Priority date	—
Expiry date	Nov 1, 2042

Classification

Technology area (CPC G)Physics
CPC primaryG06F30/10
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A method for generating a test plan for testing a measurement object includes obtaining a data record representing the measurement object. The method includes setting a reference structure based on the data. The method includes assigning at least one reference structure-specific test feature to the reference structure. A test is carried out based on data for the data record representing the measurement object as to whether structures that are similar to or the same as the reference structure are present. The reference structure-specific test feature is assigned to each similar or same structure as the structure-specific test feature. The method includes generating the test plan to include the structure-specific test features.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.