Optical measuring method and optical measuring apparatus
US12025427B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 14, 2019 |
| Grant date | Jul 2, 2024 |
| Priority date | — |
| Expiry date | Mar 10, 2041 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N13/221
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
The invention relates to an optical measuring method for the three-dimensional detection of the surface of an object using an optical recording unit. The optical recording unit is moved relative to the object during a first measurement time interval, height maps are successively detected by the recording unit at a recording frequency, and at least some of the detected height maps are each added to an overall height map and displayed. The recording frequency is regulated by control signals during the measurement time interval. The control signals are generated spaced apart in time and for the purposes of producing each control signal, a statistic for the quality of the height map is determined for the respectively last detected height image and used for producing the control signal. The statistic is the overall intensity and/or the maximum intensity and/or the contrast and/or the number of extracted data points and/or a quality of extracted data points and/or the signal-to-noise ratio and/or the contrast of an additionally generated color image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.