Patent · US Active

Measuring device

US12025474B2 · kind B2 · utility

0Cited by

1References

21Claims

0Family size

Assignee

DR. JOHANNES HEIDENHAIN GMBH · DE

Inventors

Daniel Auer · Traunstein, DE
Christoph Heinemann · Übersee, DE
Marc Oliver Tiemann · Salzburg, AT

Key dates

Filing date	Jul 14, 2020
Grant date	Jul 2, 2024
Priority date	—
Expiry date	Jun 30, 2041

Classification

Technology area (CPC G)Physics
CPC primaryG01L3/145
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A measuring device includes first and second component groups rotatable about an axis relative to each other. The first component group has a scanning component, having a first substrate, and the second component group has a scale component, having a second substrate and an angle scale. The measuring device can determine a relative angular position between the component groups. The measuring device has a passive sensor array having conductor track structures. The conductor track structures are applied on the first substrate by an additive process so that the sensor array determines a torsional load of the first substrate about the axis. Alternatively, the conductor track structures are applied on the second substrate by an additive process so that the sensor array determines a torsional load of the second substrate about the axis.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.