System for calibration management and method of managing calibration
US12025687B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Aug 6, 2021 |
| Grant date | Jul 2, 2024 |
| Priority date | — |
| Expiry date | Aug 6, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R35/005
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for calibration management is described. The system includes at least one measurement instrument for testing a device under test and a monitoring device. The monitoring device is connected with the measurement instrument. The monitoring device collects parameters from the measurement instrument during the testing. The monitoring device creates a calibration fingerprint based on the parameters collected, which is indicative of the calibration status of the measurement instrument. The system includes an interface via which information based on the calibration fingerprint is outputted, indicating if a new calibration of the measurement instrument is necessary or not. Further, a method of managing calibration of a measurement instrument is described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.