Object specific measuring with an opto-electronic measuring device
US12025736B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 7, 2020 |
| Grant date | Jul 2, 2024 |
| Priority date | — |
| Expiry date | Mar 27, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S17/87
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for controlling an opto-electronic measuring device for radiation based object point measuring such as a laser tracker, laser scanner, multi beam scanner, laser profiler, scanning total station, flash lidar, airborne scanning lidar or scanning multi station. The power of the emitted measurement radiation is object individually automatically varied specific for a direction and distance to respective objects whereby the power is adjusted in such a way that it does not exceed a predefined distance dependent power limit applying to the respective object distance precisely when the measurement radiation is emitted in the respective object direction.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.