Abnormality determination system, abnormality determination apparatus, and abnormality determination method
US12026040B2 · kind B2 · utility
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13Claims
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Key dates
| Filing date | Aug 29, 2022 |
| Grant date | Jul 2, 2024 |
| Priority date | — |
| Expiry date | Dec 2, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B2219/37435
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An abnormality determination system includes first data acquisition circuitry configured to acquire time-series data relating to an operation of a device, sample data creation circuitry configured to create sample data based on abnormality time-series data which the first data acquisition circuitry acquires while an abnormality occurs in the operation of the device, and first abnormality determination circuitry configured to determine the abnormality in the operation of the device based on the time-series data and the sample data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.