Methods, apparatuses and systems for surview scan
US12026884B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 18, 2022 |
| Grant date | Jul 2, 2024 |
| Priority date | — |
| Expiry date | Mar 9, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30201
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods, apparatuses, and systems for surview scans are provided. In one aspect, a method includes: collecting a static image for a subject on a scan bed when it is stationary; determining a scan beginning position and a reference position in the static image; obtaining a first distance between the scan beginning position and the reference position; during a movement of the scan bed, obtaining a video image of the subject in real time; identifying a corresponding reference position in the video image; marking, according to the corresponding reference position and the first distance, a corresponding scan beginning position in the video image; detecting a second distance between the corresponding scan beginning position and a positioning line in the video image; and in response to detecting that the second distance is equal to or less than a predetermined first threshold, starting the surview scan to obtain a surview image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.