Patent · US Active

Dyeing effect prediction method, training method of dyeing effect prediction model, electronic device and storage medium

US12026963B1 · kind B1 · utility

0Cited by
1References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 6, 2023
Grant dateJul 2, 2024
Priority date
Expiry dateDec 6, 2043

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02P90/30
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Provided is a dyeing effect prediction method, a training method of a dyeing effect prediction model, an electronic device, and a storage medium, relating to the field of computers, and in particular to artificial intelligence technologies, neural network model technologies and model training technologies. The dyeing effect prediction method includes decomposing Raman spectrum data of a to-be-detected yarn spindle into a plurality of sub-signal data by using a wavelet basis function; determining a feature of the to-be-detected yarn spindle according to at least a part of target sub-signal data in the plurality of sub-signal data; and predicting to obtain a first dyeing label according to the feature of the to-be-detected yarn spindle by using a dyeing effect prediction model, wherein the first dyeing label is used for representing a dyeing effect grade.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.