Quality prediction method, preparation method and system of high resistance gallium oxide based on deep learning and Czochralski method
US12031230B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 7, 2021 |
| Grant date | Jul 9, 2024 |
| Priority date | — |
| Expiry date | Jun 28, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG16C60/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A quality prediction method, a preparation method and a system of high resistance gallium oxide based on deep learning and Czochralski method. The quality prediction method includes the steps of obtaining preparation data of high resistance gallium oxide single crystal prepared by Czochralski method. The preparation data includes a seed crystal data, an environmental data, and a control data. The environmental data includes doping element concentration and doping element type; preprocessing the preparation data to obtain a preprocessed preparation data; preparing the preprocessed data is input to a trained neural network model, and a predicted quality data corresponding to the high resistance gallium oxide single crystal is obtained through the trained neural network model, and the predicted quality data includes a predicted resistivity.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.