Multi-parameter test and calibration system and method for spectrometer based on nanosecond light source
US12031865B2 · kind B2 · utility
Inventors
Key dates
| Filing date | Apr 20, 2022 |
| Grant date | Jul 9, 2024 |
| Priority date | — |
| Expiry date | Oct 17, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/28
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present disclosure provides a multi-parameter calibration system for a spectrometer based on a nanosecond light source, including a main channel for outputting nuclear pulse signals, and a coincidence channel for outputting the nuclear pulse signals. Each channel uses current nuclear pulse signals to drive a light-emitting diode (LED) to emit nuclear pulse optical signals, and a simulated scintillator is irradiated to emit nanosecond nuclear pulse optical signals. The present disclosure can respectively test and calibrate multiple parameter performance indexes of the spectrometer throughput baseline restoration spectrometer. The stability of the spectrometer is tested and calibrated through output of certain regular nuclear pulse signals.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.