Resistance calibration and monitoring of thermal systems
US12031875B2 · kind B2 · utility
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3References
10Claims
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Key dates
| Filing date | Apr 8, 2021 |
| Grant date | Jul 9, 2024 |
| Priority date | — |
| Expiry date | May 2, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K2007/163
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of calibrating temperature of a resistive element having a material with a Curie temperature includes generating a standard resistance-temperature (R-T) curve for the resistive element in isothermal conditions to identify values of the R-T curve and an inflection point at the Curie temperature, generating operational R-T curves for the resistive element over an operational time period, comparing the standard R-T curve to the operational R-T curves, and adjusting the operational curves to the standard R-T curve at the Curie temperature to calibrate temperature of the resistive element.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.