Physical state measurement device
US12031929B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 17, 2021 |
| Grant date | Jul 9, 2024 |
| Priority date | — |
| Expiry date | Jun 30, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/032
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A physical state measurement apparatus includes a main solid material which generates fluorescence by excitation light from a light source part. A microwave application part applies microwaves to the main solid material so as to control an electron state of the main solid material. A detection part detects the physical state of an object to be measured by the fluorescence from the main solid material. A feedback part has a solid material for feedback and a control part and detects a difference in amplitude between operating points on a low-frequency side and a high-frequency side of a lowering portion of a spectrum amplitude centered on a resonance frequency of an electron spin resonance spectrum of fluorescence from the solid material for feedback and feedback-controls the microwave application part such that the difference becomes zero.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.