Examining apparatus, examining method and recording medium
US12032353B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 14, 2018 |
| Grant date | Jul 9, 2024 |
| Priority date | — |
| Expiry date | Mar 18, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B2219/33034
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
To easily perform examination of at least one facility based on detection signals of a plurality of sensors installed in the facility. Provided are an examining apparatus, an examining method and a recording medium, including: a group designation acquiring unit to acquire designation of a targeted group including a plurality of targeted sensors to be analyzed among a plurality of sensors installed in at least one facility; a sensor data acquiring unit to acquire sensor data from each targeted sensor included in the targeted group; a learning unit to learn an analysis model by using the sensor data from each targeted sensor included in the targeted group; and an examining unit to examine the facility by using the learned analysis model.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.