Patent · US Active

Calibration circuit and semiconductor device including the same

US12033717B2 · kind B2 · utility

0Cited by
8References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 6, 2022
Grant dateJul 9, 2024
Priority date
Expiry dateJan 5, 2043

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2207/2254
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A calibration circuit includes a first, second and third pull-up units each connected to a first power supply node, and first and second pull-down units each connected to a second power supply node. A first code generator is configured to generate a first code by comparing a voltage of a pad at which the first pull-up unit is connected to an external resistor with a reference voltage, and a second code generator is configured to generate a second code by comparing a voltage of a first intermediate node with the reference voltage and output the second code to the first and second pull-down units. A third code generator is configured to generate a third code by comparing a voltage of a second intermediate node between the second pull-down unit and the third pull-up unit with the reference voltage.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.