Fault detection system

US12034281B2 · kind B2 · utility

Assignee

• ABB Schweiz AG · CH

Inventors

• Joerg Ostrowski · Zürich, CH
• Kai Hencken · Bad Kötzting, DE
• Ralf Gitzel · Mannheim, DE
• Joerg Gebhardt · Mainz, DE
• Oliver Becker · Ludwigsburg, DE
• Maciej Mruczek
• Tomas Kozel · Brno, CZ
• Anastasios Papageorgiou · Zürich, CH

Key dates

• Filing date: Apr 14, 2022
• Grant date: Jul 9, 2024
• Expiry date: Jan 6, 2043

Classification

• Technology area (CPC G): Physics
• CPC primary: G01K2003/145
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A fault detection system and method includes a sensor; a processing unit; and an output unit. The sensor is configured to acquire temperature data at a sensor location of a device, wherein the temperature data comprises first temperature data and second temperature data acquired a first time period after the first temperature data. The processing unit determines a temperature magnitude comprising utilization of the first temperature data and/or the second temperature data, and determines a rate of change of temperature. The processing unit predicts a temperature at a location of the device using the temperature magnitude, the rate of change of temperature, and a correlation, wherein the correlation is a correlation of a plurality of temperature magnitudes and a plurality of rate of change of temperatures at the sensor location with a plurality of hotspot temperatures at the location.