Testing apparatus, control device system, and testing method
US12038466B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 8, 2021 |
| Grant date | Jul 16, 2024 |
| Priority date | — |
| Expiry date | Aug 11, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2844
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A testing apparatus for testing electrical components and/or conductor track structures. The testing apparatus includes: a multiplicity of testing locations, each receiving an electrical component and/or a conductor track structure; a selection device for selecting one of the testing locations; electrical lines disposed in rows and electrical lines disposed in columns for the supply of an alternating voltage to the component or structure, situated at the selected testing location; Z diodes for the electrical connection of the respective component and/or structure at the respective testing location via one of the Z diodes to one of the rows of electrical lines; a signal generator developed to generate a test signal that has a voltage signal as the sum of a square wave signal and a wave-shaped signal; and an electromigration device for applying a direct voltage signal to the components and/or structures to bring about electromigration in the components and/or structures.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.