Identifying arrangement errors of detector elements within a gamma-ray detector system
US12042326B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 5, 2021 |
| Grant date | Jul 23, 2024 |
| Priority date | — |
| Expiry date | May 27, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01T7/005
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
In a gamma-ray detector system, such as a PET detector, coincidence events between multiple detector elements can be caused by inter-detector scattering and/or energy escape of the multi-stage radiation background in the scintillator crystals. Because these types of coincidence events are more likely to happen between nearby elements, they can be measured, analyzed and ultimately used to identify arrangement errors of detector elements in a gamma-ray detector system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.