Image-based search and prediction system for physical defect investigations
US12045835B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jan 21, 2021 |
| Grant date | Jul 23, 2024 |
| Priority date | — |
| Expiry date | Dec 5, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20081
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Techniques are provided for image-based search and prediction for physical defect investigations. One method comprises obtaining, for multiple investigations of physical defects associated with corresponding devices, (i) images of the physical defects, (ii) descriptions of the physical defects, and (iii) descriptions of a manual classification of the physical defects; storing the images for each investigation in an image repository, wherein each stored image comprises a set of tags based on the corresponding description of the physical defect and the corresponding description of the manual classification of the physical defect; and training an image classification model using the stored images, each with the corresponding description of the physical defect and the corresponding manual classification of the physical defect. A given investigation of a physical defect can be resolved using the image repository and/or the trained image classification model.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.