Apparatus for inspecting a display panel for defects
US12046167B2 · kind B2 · utility
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3References
23Claims
0Family size
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Key dates
| Filing date | Jul 16, 2019 |
| Grant date | Jul 23, 2024 |
| Priority date | — |
| Expiry date | Jul 13, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/95615
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for inspecting a display panel for defects includes a table which supports the display panel, a laser excitation unit that irradiates a non-display area of the display panel with a point laser beam, a thermal wave detecting unit that generates thermal wave images of irradiated portions of the non-display area, a driving unit, and a control unit. A groove corresponding to an edge of the display panel may be defined in a top surface of the table. A defect, such as a crack, may be detected by comparing a defect pattern obtained from the thermal wave images with a pre-registered defect pattern.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.