Gathering and analyzing assessment data using customizable ontologies built upon a meta model
US12046354B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 19, 2023 |
| Grant date | Jul 23, 2024 |
| Priority date | — |
| Expiry date | Apr 19, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG16H10/20
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A meta model may be provided as a global structure providing flexible or customizable options for a specific ontology designed by a system operator. A meta model may include generic structures, such as attributes, attribute categories, and attribute properties. A system operator may configure a set of specific attributes, attribute categories, and synthesis rules within the meta model to define a desired ontology, customizing the system to a specific purpose. A system can receive assertions about points of interest known to the system, and store information about attributes of points of interest based on the specified ontology.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.