Inspection unit of a transfer device for transferring components between substrates
US12046491B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 23, 2019 |
| Grant date | Jul 23, 2024 |
| Priority date | — |
| Expiry date | Mar 25, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05K13/0419
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
The invention relates to an inspection unit intended for use in devices for transferring electronic components from a first substrate to a second substrate and/or for applying adhesive from a reservoir to the second substrate, comprising an image capturing unit, which is assigned an illumination unit, wherein the illumination unit is designed to direct light of different wavelengths onto a second holder, which in turn is designed to support an object located on the second substrate, which is to be captured by the image capturing unit, wherein a sixteenth, seventeenth, eighteenth and/or nineteenth conveying unit is designed to convey the respective image capturing unit and/or its associated optics, including focussing optics, a beam deflector and/or an illumination unit, along the second holder.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.