Method for detecting phosphate and/or sulphate salts on the surface of a substrate or within a substrate, use of a LWIR detecting device and a LWIR imaging system
US12050174B2 · kind B2 · utility
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4References
23Claims
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Key dates
| Filing date | Jul 19, 2019 |
| Grant date | Jul 30, 2024 |
| Priority date | — |
| Expiry date | Oct 31, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/0633
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention refers to method for detecting phosphate and/or sulphate salts on the surface of a substrate or within a substrate, use of a LWIR detecting device for detecting the intensity of electromagnetic radiation scattered and/or emitted reflection by phosphate and/or sulphate salts being present on and/or in a substrate, use of a substrate comprising phosphate and/or sulphate salts for providing information via electromagnetic radiation scattering and/or emission as well as a LWIR imaging system for detecting phosphate and/or sulphate salts on and/or within a substrate.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.