Method for extracting raman characteristic peaks employing improved principal component analysis
US12050179B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 12, 2020 |
| Grant date | Jul 30, 2024 |
| Priority date | — |
| Expiry date | Feb 27, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/1293
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for extracting Raman characteristic peaks employing improved principal component analysis comprising: using a confocal microscopic Raman-spectroscopic instrument to collect Raman spectroscopic data from surfaces of pork and beef samples; and performing preprocessing on the Raman spectroscopic data, performing principal component analysis, establishing a principal component loading scatter plot, extracting dot characteristics from the principal component loading scatter plot, analyzing same, and performing filtering on the dot characteristics to obtain Raman characteristic peaks. The method for extracting Raman characteristic peaks employing improved principal component analysis is used to extract Raman characteristic peaks from pork and beef samples, and then the Raman characteristic peaks are inputted into a classifier to undergo classification, thereby achieving high accuracy and quick classification.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.