Non-destructive test fixture for screening electrical continuity
US12050253B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 1, 2020 |
| Grant date | Jul 30, 2024 |
| Priority date | — |
| Expiry date | Nov 14, 2040 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61N2001/083
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A test fixture (20) for testing continuity in at least one electrode of a neuromodulation device. The test fixture may comprise a substrate (22), at least one electrically conductive pad (24a) disposed on the substrate for reducing pressure applied to the at least one electrode when the electrically conductive pad makes contact with an exposed surface of the electrode, and a wire (26a) extending from the at least one electrically conductive pad. The pad may be formed of a non-abrasive material, such as conductive foam or smooth metal. The substrate may be a probe formed with a number of slots for holding pads and routing wires, a mandrel with openings for holding pads and routing wires, and a flexible circuit with exposed smooth metal surfaces. The test fixture may be suitable for testing cuff-like and paddle-like devices.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.