Quality defect marking systems and methods in packaging product manufacturing
US12051190B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 6, 2021 |
| Grant date | Jul 30, 2024 |
| Priority date | — |
| Expiry date | Jul 9, 2042 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB65B63/005
- WIPO fieldTextile and paper machines
- WIPO sectorMechanical engineering
Abstract
Systems and methods for detecting and marking quality defects on individual packaging products being processed through converting machines at high speeds are provided. An example system comprises a controller in communication with a first and second sensor as well as a first and second marker. The first and second sensors sense data corresponding to a first type and second type, respectively, of potential defects in the manufacture of the packaging product, enabling detection of a first- and second-type defect. The controller may be configured to trigger a first marker to mark the individual packaging product with a first mark for the first-type defect; and to trigger a second marker to mark the packaging product with a second mark for the second-type defect. Thus, the type of defects detected on an individual packaging product may be readily indicated on the individual packaging product itself.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.