Machine learning a feature detector using synthetic training data
US12051235B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 13, 2020 |
| Grant date | Jul 30, 2024 |
| Priority date | — |
| Expiry date | Aug 15, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T17/20
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Synthetic training information/data of a second probe style is generated based on first probe information/data of a first probe style using a style transfer model. First probe information/data is defined. An instance of first probe information/data comprises labels and first probe style sensor information/data. A style transfer model generates training information/data based on at least a portion of the first probe information/data. An instance of training information/data corresponds to an instance of first probe information/data and comprises second probe style sensor information/data. The first and second probe styles are different. A second probe style model is trained using machine learning and the training information/data. The second probe style model is used to analyze second probe style second probe information/data to extract map information/data from the second probe information/data. Each instance of second probe data is captured by one or more second probe sensors of a second probe apparatus.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.