Patent · US Active

High-density memory cells and layouts thereof

US12051457B2 · kind B2 · utility

0Cited by
5References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 23, 2022
Grant dateJul 30, 2024
Priority date
Expiry dateMay 23, 2042

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C11/405
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A device includes a write bit line and a read bit line extending in a first direction, and a write word line and a read word line extending in a second direction perpendicular to the first direction. The device further includes a memory cell including a write transistor and a read transistor. The write transistor includes a first gate connected to the write word line, a first source/drain connected to the write bit line, and a second source/drain connected to a data storage node. The read transistor includes a second gate connected to the data storage node, a third source/drain connected to the read bit line, and a fourth source/drain connected to the read word line.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.