Focus scan type imaging device for imaging target object in sample that induces aberration
US12055491B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Oct 12, 2020 |
| Grant date | Aug 6, 2024 |
| Priority date | — |
| Expiry date | Jul 20, 2041 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N23/67
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A focus scan type imaging device for imaging a target object in a sample that induces aberration proposed. The device includes: a light source unit for emitting a beam; an optical interferometer for splitting the beam emitted from the light source into a sample wave and a reference wave, and providing an interference wave formed by interference between a reflection wave that is the sample wave reflected from the sample and the reference wave; a camera module for imaging the interference wave; a scanning mirror disposed on an optical path of the sample wave of the optical interferometer and configured to reflect the sample wave to cause the sample wave to scan the sample; a wavefront shaping modulator disposed on the optical path of the sample wave of the optical interferometer; and an imaging controller configured to operate in a phase map calculation mode and in an imaging mode.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.