Method and apparatus for automated generation of a test plan to measure a measurement object
US12055913B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 17, 2020 |
| Grant date | Aug 6, 2024 |
| Priority date | — |
| Expiry date | Dec 23, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B2219/37456
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for generating a resultant test plan for testing a measurement object includes generating at least one data record by measuring the measurement object. The method includes assigning at least part of the measurement object to at least one object class based on the at least one data record. The method includes determining a test plan assigned to the at least one object class as an object-class-specific test plan. The method includes determining the resultant test plan based on the object-class-specific test plan. The assignment of the at least part of the measurement object to the at least one object class is independent of dimensions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.