Method and system of evaluating the valid analysis region of a specific scene
US12056910B2 · kind B2 · utility
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3References
15Claims
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Key dates
| Filing date | Jan 1, 2020 |
| Grant date | Aug 6, 2024 |
| Priority date | — |
| Expiry date | Feb 8, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30248
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and system of evaluating a valid analysis region of a specific scene, wherein the method and system performs image analyses on continuous images/frames of a specific scene to obtain detectable object or event information therein, so as to generate a closed valid analysis region to reduce the overall data and loading of image analyses during actual monitoring, processing and analyzing of the specific scene.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.