Patent · US Active

Calibration method for a TDR measurement

US12061107B2 · kind B2 · utility

0Cited by
3References
3Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJul 16, 2021
Grant dateAug 13, 2024
Priority date
Expiry dateNov 25, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01S13/88
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of calibrating a TDR measurement comprising determining an echo profile of a calibration trace, and comparing a determined length of an actual physical length taking into account dimensional variables due to temperature fluctuations, then deriving and storing a calibration factor, and using that calibration factor to determine a system clock distance calibration, with the calibration factor being a ratio of the clock cycles to ensure that the determined electronic length is equal to the actual physical length. Once the system clock has been calibrated, measurement of the distance along the probe to the liquid height, plunger height, and so on, can then be determined with very high accuracy, using very low-cost electronic components.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.