Patent · US Active

Device and method for analyzing a material

US12066378B2 · kind B2 · utility

0Cited by

24References

38Claims

0Family size

Assignee

DiaMon Tech AG · DE

Inventors

Alexander Bauer · Rosenheim, DE
Otto Hertzberg · Frankfurt am Main, DE
Thorsten Lubinski · Berlin, DE

Key dates

Filing date	Mar 18, 2022
Grant date	Aug 20, 2024
Priority date	—
Expiry date	Mar 18, 2042

Classification

Technology area (CPC G)Physics
CPC primaryG01N2021/1725
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An apparatus for analyzing a material includes an excitation emission device for generating at least one electromagnetic excitation beam, in particular an exciting light beam, having at least one excitation wavelength, further comprising a detection device for detecting a reaction signal, and a device for analyzing the material on the basis of the detected reaction signal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.