Method and device for scanning a sample
US12066614B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Sep 19, 2019 |
| Grant date | Aug 20, 2024 |
| Priority date | — |
| Expiry date | Oct 14, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/0076
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A method for scanning a sample in microscopy includes generating at least three illumination spots in order to form a spot pattern that contains at least two illumination spots having a first wavelength and an illumination spot having a second wavelength that differs from the first wavelength. At least one specified region of the sample is scanned by moving the spot pattern formed by the illumination spots along a first direction for generating scan lines, which are each associated with the illumination spots of the spot pattern, and by moving the spot pattern formed by the illumination spots along a second direction for generating scan lines respectively after the scan lines.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.