Ghost imaging second harmonic generation microscopy
US12066617B2 · kind B2 · utility
0Cited by
0References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 9, 2021 |
| Grant date | Aug 20, 2024 |
| Priority date | — |
| Expiry date | Mar 25, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/10056
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and methods for ghost imaging second harmonic generation microscopy. Imaging data is collected in parallel, providing faster imagine reconstruction and enabling reconstruction in scattering environments. Ghost imaging, split light beam interacting with a target and a second light beam unimpeded and not required to pass through the same background. A second harmonic generation image is reconstructed from the detected photons.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.